The TI 950 combines Hysitron’s patented three plate capacitive transducer* technology with state-of-the-art control technology to achieve unmatched performance in nanomechanical characterization. The system features a sub 30 nN force noise floor, ultra-fast feedback control, user-definable data acquisition rates up to 30 kHz, the widest range of nanomechanical testing techniques, and the ability to test with various Hysitron heads seamlessly. The superior staging system on the TI 950, along with the in-situ Scanning Probe Microscopy (SPM) imaging capability, provides unparalleled precision in test-placement accuracy and data repeatability

	Z-Axis	X-Axis
Maximum Force	10mN	2mN
Load Resolution	1nN	3µN
Load Noise Floor	100nN	10µN
Maximum Displacement	5µm	15µm
Displacement Resolution	0.04nm	4nm
Displacement Noise Floor	0.2nm	10nm
Thermal Drift	<0.05nm/sec	<0.05nm/sec